| TEST DATA DOCUMENT | 96906-MIL-STD-883 STANDARD (INCLUDES INDUSTRY OR ASSOCIATION STANDARDS, INDIVIDUAL MANUFACTUREER STANDARDS, ETC.). |
| FEATURES PROVIDED | MONOLITHIC AND PROGRAMMABLE AND ULTRAVIOLET ERASABLE |
| OUTPUT LOGIC FORM | N-TYPE METAL OXIDE-SEMICONDUCTOR LOGIC |
| VOLTAGE RATING AND TYPE PER CHARACTERISTIC | 7.0 VOLTS MAXIMUM TOTAL SUPPLY |
| STORAGE TEMP RANGE | -65.0 TO 150.0 DEG CELSIUS |
| TERMINAL SURFACE TREATMENT | SOLDER |
| BODY LENGTH | 1.285 INCHES MAXIMUM |
| INCLOSURE CONFIGURATION | DUAL-IN-LINE |
| TERMINAL TYPE AND QUANTITY | 24 PRINTED CIRCUIT |
| OPERATING TEMP RANGE | -55.0 TO 125.0 DEG CELSIUS |
| INPUT CIRCUIT PATTERN | 14 INPUT |
| MEMORY DEVICE TYPE | PROM |
| BODY WIDTH | 0.600 INCHES MAXIMUM |
| INCLOSURE MATERIAL | CERAMIC |
| BODY HEIGHT | 0.185 INCHES MAXIMUM |